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How We Used AT1032S to Hunt Down a HardFault in a Factory Network

· 6 min read
Ibrahim Kamal
Ibrahim Kamal
CEO @ Ikalogic

AT1032S reproducing a real CANopen and Modbus setup in the lab

We were working on a CANopen-to-Modbus converter for a factory project when the firmware decided to develop a personality.

Every now and then, the converter would crash with a HardFault. Not every hour. Not every test cycle. Not even every shift. More like once every one or two days, just often enough to be a serious problem and just rarely enough to be deeply annoying.

And of course, the bug only showed up in the real installation.

In a factory, that is a terrible place to play "let's try stuff and see what happens." The environment is mission-critical, the system has to keep doing its job, and nobody is excited about an engineer showing up with a cable and a chaotic debugging plan.

So we needed a different approach: bring the factory home.

New State Machine Decoder: Debug Your State Machines with Ease

· 5 min read
Ibrahim Kamal
Ibrahim Kamal
CEO @ Ikalogic

Debugging state machines can be challenging, especially when you're trying to understand complex state transitions in real-time hardware. We're pleased to announce significant enhancements to ScanaStudio's State Machine decoder, making it easier than ever to visualize and analyze state machine behavior captured with your logic analyzer.

Introducing the New Dual ADC Decoder for ScanaStudio

· 4 min read
Ibrahim Kamal
Ibrahim Kamal
CEO @ Ikalogic

We're excited to announce the release of a new ADC decoder script for ScanaStudio, designed to simplify the analysis of parallel ADC data captured with your logic analyzer. Whether you're debugging analog signal acquisition systems, verifying ADC performance, or analyzing I/Q data streams, this new decoder provides the flexibility and visualization tools you need.

SP1018G, A Cost-Effective Pattern Generation Alternative for Semiconductor Testing

· 3 min read
Ibrahim Kamal
Ibrahim Kamal
CEO @ Ikalogic

Introduction

In the world of semiconductor testing, Automatic Test Equipment (ATE) is often associated with high performance—and high costs (ranging from hundreds of thousands to millions of dollars). For DFT (Design for Test) and QA engineers seeking a much more affordable yet capable solution, the SP1018G from the SP1000G Series offers an innovative alternative. With advanced pattern generation capabilities and scripting flexibility, the SP1018G provides a streamlined approach to testing and verification without the hefty price tag of traditional ATE systems.